Osnovni cilj predmeta je podati študentom teoretična in praktična znanja (know-how) s področja rentgenske absorpcijske in emisijske spektrometrije in mikroskopije s sub-mikronsko resolucijo s sinhrotronsko svetlobo, potrebna za uspešno samostojno karakterizacijo atomske in molekularne strukture različnih materialov z metodama XANES in EXAFS (vključno z in-oparando in in-situ načinom), in za analizo 2D in 3D porazdelitve elementov z metodo mikro-XRF, posebej v tkivih rastlin na subceličnem nivoju. Študentje pridobijo potrebne kompetence za pripravo konkurenčnega projekta za pridobitev merilnega časa v sinhrotronskih laboratorijih, za pripravo in izvedbe eksperimenta v sinhrotronskih laboratorijih ter za kvantitativne analize meritev in interpretacije rezultatov.
The main goal of the course is to provide students with theoretical and practical knowledge (know-how) in the field of X-ray absorption and emission spectroscopy and microscopy with sub-micron resolution with synchrotron light, necessary for characterization of atomic and molecular structure of various materials by XANES and EXAFS ( including in-oparando and in-situ mode), and for the analysis of 2D and 3D distribution of elements by the micro-XRF method, especially in plant tissues at the subcellular level. Students acquire the necessary competencies for the preparation of a competitive project for obtaining measurement time in synchrotron laboratories, for the preparation and implementation of experiments in synchrotron laboratories, and for quantitative analyzes of measurements and interpretation of results.
- Teacher: Iztok Arčon